We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
ASTM – The company, ASTM International, belongs to the largest independent worldwide companies that deal with the development of standards, they are a reliable source of technical standards for materials, products, systems and services. ASTM International standards are known for their high technical quality and market relevancy and that is why they have an important role in the information infrastructure, which conducts projecting, manufacturing and trade in global economy. ASTM publishes standards dealing with metals, combustibility, chemical products, lubricants, fossil fuels, textiles, paints, rubber, piping, forensic sciences, electronics, energetic industry, medical devices and many other subjects.
Standard Test Method for Measuring Boron Contamination in Heavily Doped N-Type Silicon Substrates by Secondary Ion Mass Spectrometry (Withdrawn 2003)
WITHDRAWN published on 10.12.1999
Selected format:Standard Test Method for Sheet Resistance Uniformity Evaluation by In-Line Four-Point Probe with the Dual-Configuration Procedure
WITHDRAWN published on 10.12.2002
Selected format:Standard Test Method for Sheet Resistance Uniformity Evaluation by In-Line Four-Point Probe with the Dual-Configuration Procedure (Withdrawn 2003)
WITHDRAWN published on 5.12.1997
Selected format:Standard Test Method for Determining the Yield of Wide Inked Computer Ribbons
WITHDRAWN published on 1.1.1995
Selected format:Standard Test Method for Determining the Yield of Wide Inked Computer Ribbons
WITHDRAWN published on 10.9.1995
Selected format:Standard Test Method for Determining the Yield of Wide Inked Computer Ribbons (Withdrawn 2015)
WITHDRAWN published on 1.1.2008
Selected format:Standard Test Method for Measuring Flatness, Thickness, and Thickness Variation on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003)
WITHDRAWN published on 10.12.2002
Selected format:Standard Test Method for Measuring Flatness, Thickness, and Thickness Variation on Silicon Wafers by Automated Noncontact Scanning
WITHDRAWN published on 1.1.1994
Selected format:Standard Test Method for Comparing Printer or Copier Cartridges (Withdrawn 2003)
WITHDRAWN published on 1.1.1994
Selected format:Standard Guide for Qualification, Selection, Training, Utilization, and Supervision of Security Screening Personnel (Withdrawn 2001)
WITHDRAWN published on 1.1.1994
Selected format:Latest update: 2024-04-26 (Number of items: 2 896 057)
© Copyright 2024 NORMSERVIS s.r.o.