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Standards ASTM - American technical standards - Page 7850
ASTM – The company, ASTM International, belongs to the largest independent worldwide companies that deal with the development of standards, they are a reliable source of technical standards for materials, products, systems and services. ASTM International standards are known for their high technical quality and market relevancy and that is why they have an important role in the information infrastructure, which conducts projecting, manufacturing and trade in global economy. ASTM publishes standards dealing with metals, combustibility, chemical products, lubricants, fossil fuels, textiles, paints, rubber, piping, forensic sciences, electronics, energetic industry, medical devices and many other subjects.
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ASTM F1259-89
Historical
Show all technical information.
Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration
WITHDRAWN published on 1.1.1989
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ASTM F1259M-96
Historical
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Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric]
WITHDRAWN published on 1.1.1996
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ASTM F1259M-96(2003)
Historical
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Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric] (Withdrawn 2009)
WITHDRAWN published on 10.6.1996
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ASTM F126
Historical
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Definitions of Terms Relating to Which Relate to the Use and Testing of Ferrite Memory Cores and Memory Core Arrays (Withdrawn 1976)
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ASTM F1260-89
Historical
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Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations
WITHDRAWN published on 1.1.1989
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ASTM F1260M-96
Historical
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Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]
WITHDRAWN published on 1.1.1996
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ASTM F1260M-96(2003)
Historical
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Standard Test Method for Estimating Electromigration Median Time-to-Failure and Sigma of Integrated Circuit Metallizations [Metric] (Withdrawn 2009)
WITHDRAWN published on 10.6.1996
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ASTM F1261M-96
Historical
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Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric]
WITHDRAWN published on 1.1.1996
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ASTM F1261M-96(2003)
Historical
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Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric] (Withdrawn 2009)
WITHDRAWN published on 10.6.1996
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ASTM F1262M-14
Historical
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Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)
WITHDRAWN published on 1.6.2014
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