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ASTM – The company, ASTM International, belongs to the largest independent worldwide companies that deal with the development of standards, they are a reliable source of technical standards for materials, products, systems and services. ASTM International standards are known for their high technical quality and market relevancy and that is why they have an important role in the information infrastructure, which conducts projecting, manufacturing and trade in global economy. ASTM publishes standards dealing with metals, combustibility, chemical products, lubricants, fossil fuels, textiles, paints, rubber, piping, forensic sciences, electronics, energetic industry, medical devices and many other subjects.
Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations
WITHDRAWN published on 1.1.1989
Selected format:Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]
WITHDRAWN published on 1.1.1996
Selected format:Standard Test Method for Estimating Electromigration Median Time-to-Failure and Sigma of Integrated Circuit Metallizations [Metric] (Withdrawn 2009)
WITHDRAWN published on 10.6.1996
Selected format:Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric]
WITHDRAWN published on 1.1.1996
Selected format:Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric] (Withdrawn 2009)
WITHDRAWN published on 10.6.1996
Selected format:Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)
WITHDRAWN published on 1.6.2014
Selected format:Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
WITHDRAWN published on 10.11.1995
Selected format:Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
WITHDRAWN published on 10.12.2002
Selected format:Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
WITHDRAWN published on 15.6.2008
Selected format:Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
WITHDRAWN published on 1.6.2011
Selected format:Latest update: 2025-12-29 (Number of items: 2 253 390)
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