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ASTM – The company, ASTM International, belongs to the largest independent worldwide companies that deal with the development of standards, they are a reliable source of technical standards for materials, products, systems and services. ASTM International standards are known for their high technical quality and market relevancy and that is why they have an important role in the information infrastructure, which conducts projecting, manufacturing and trade in global economy. ASTM publishes standards dealing with metals, combustibility, chemical products, lubricants, fossil fuels, textiles, paints, rubber, piping, forensic sciences, electronics, energetic industry, medical devices and many other subjects.
Standard Specification for Cautionary Labeling for Five-Gallon Open-Head Plastic Containers
WITHDRAWN published on 1.1.2004
Selected format:Standard Specification for Cautionary Labeling for Five-Gallon Open-Head Plastic Containers (Withdrawn 2018)
WITHDRAWN published on 15.12.2009
Selected format:Standard Guide for Scope of Performance of First Responders Who Practice in the Wilderness or Delayed or Prolonged Transport Settings
WITHDRAWN published on 15.8.1995
Selected format:Standard Guide for Scope of Performance of First Responders Who Practice in the Wilderness or Delayed or Prolonged Transport Settings
WITHDRAWN published on 15.8.1995
Selected format:Standard Guide for Scope of Performance of First Responders Who Practice in the Wilderness or Delayed or Prolonged Transport Settings
WITHDRAWN published on 1.3.2009
Selected format:Standard Guide for Scope of Performance of First Responders Who Practice in the Wilderness or Delayed or Prolonged Transport Settings (Withdrawn 2025)
WITHDRAWN published on 1.6.2016
Selected format:Standard Test Method for Measuring Surface Sodium, Aluminum, Potassium, and Iron on Silicon and EPI Substrates by Secondary Ion Mass Spectrometry
WITHDRAWN published on 10.5.1998
Selected format:Standard Test Method for Measuring Surface Sodium, Aluminum, Potassium, and Iron on Silicon and EPI Substrates by Secondary Ion Mass Spectrometry (Withdrawn 2003)
WITHDRAWN published on 10.5.1998
Selected format:Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers (Withdrawn 2003)
WITHDRAWN published on 10.5.2002
Selected format:Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers
WITHDRAWN published on 1.1.1996
Selected format:Latest update: 2025-07-16 (Number of items: 2 208 753)
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