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ASTM - American technical standards - Page 7956

Standards ASTM - American technical standards - Page 7956

ASTM – The company, ASTM International, belongs to the largest independent worldwide companies that deal with the development of standards, they are a reliable source of technical standards for materials, products, systems and services. ASTM International standards are known for their high technical quality and market relevancy and that is why they have an important role in the information infrastructure, which conducts projecting, manufacturing and trade in global economy. ASTM publishes standards dealing with metals, combustibility, chemical products, lubricants, fossil fuels, textiles, paints, rubber, piping, forensic sciences, electronics, energetic industry, medical devices and many other subjects.

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Preview ASTM F1525/F1525M-09 1.10.2009 Preview of the standard
ASTM F1525/F1525M-09 Historical

Standard Guide for Use of Membrane Technology in Mitigating Hazardous Chemical Spills (Withdrawn 2015)

WITHDRAWN published on 1.10.2009

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Preview ASTM F1526-95(2000) 1.1.2000 Preview of the standard
ASTM F1526-95(2000) Historical

Standard Test Method for Measuring Surface Metal Contamination on Silicon Wafers by Total Reflection X-Ray Fluorescence Spectroscopy (Withdrawn 2003)

WITHDRAWN published on 1.1.2000

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Preview ASTM F1527-00 10.6.2000 Preview of the standard
ASTM F1527-00 Historical

Standard Guide for Application of Silicon Standard Reference Materials and Reference Wafers for Calibration and Control of Instruments for Measuring Resistivity of Silicon

WITHDRAWN published on 10.6.2000

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Preview ASTM F1527-02 10.7.2002 Preview of the standard
ASTM F1527-02 Historical

Standard Guide for Application of Certified Reference Materials and Reference Wafers for Calibration and Control of Instruments for Measuring Resistivity of Silicon (Withdrawn 2003)

WITHDRAWN published on 10.7.2002

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Preview ASTM F1528-94(1999) 10.12.1999 Preview of the standard
ASTM F1528-94(1999) Historical

Standard Test Method for Measuring Boron Contamination in Heavily Doped N-Type Silicon Substrates by Secondary Ion Mass Spectrometry (Withdrawn 2003)

WITHDRAWN published on 10.12.1999

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Preview ASTM F1529-02 10.12.2002 Preview of the standard
ASTM F1529-02 Historical

Standard Test Method for Sheet Resistance Uniformity Evaluation by In-Line Four-Point Probe with the Dual-Configuration Procedure

WITHDRAWN published on 10.12.2002

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Preview ASTM F1529-97 5.12.1997 Preview of the standard
ASTM F1529-97 Historical

Standard Test Method for Sheet Resistance Uniformity Evaluation by In-Line Four-Point Probe with the Dual-Configuration Procedure (Withdrawn 2003)

WITHDRAWN published on 5.12.1997

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Preview ASTM F153-95 1.1.1995 Preview of the standard
ASTM F153-95 Historical

Standard Test Method for Determining the Yield of Wide Inked Computer Ribbons

WITHDRAWN published on 1.1.1995

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Preview ASTM F153-95(2002) 10.9.1995 Preview of the standard
ASTM F153-95(2002) Historical

Standard Test Method for Determining the Yield of Wide Inked Computer Ribbons

WITHDRAWN published on 10.9.1995

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Preview ASTM F153-95(2008) 1.1.2008 Preview of the standard
ASTM F153-95(2008) Historical

Standard Test Method for Determining the Yield of Wide Inked Computer Ribbons (Withdrawn 2015)

WITHDRAWN published on 1.1.2008

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