ASTM - American technical standards - Page 8134

Standards ASTM - American technical standards - Page 8134

ASTM – The company, ASTM International, belongs to the largest independent worldwide companies that deal with the development of standards, they are a reliable source of technical standards for materials, products, systems and services. ASTM International standards are known for their high technical quality and market relevancy and that is why they have an important role in the information infrastructure, which conducts projecting, manufacturing and trade in global economy. ASTM publishes standards dealing with metals, combustibility, chemical products, lubricants, fossil fuels, textiles, paints, rubber, piping, forensic sciences, electronics, energetic industry, medical devices and many other subjects.

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ASTM F1892-12 Historical

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

WITHDRAWN published on 1.7.2012

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129.00 USD


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ASTM F1892-98 Historical

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

WITHDRAWN published on 10.5.1998

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119.00 USD


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ASTM F1893-11 Historical

Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

WITHDRAWN published on 1.1.2011

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83.00 USD


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ASTM F1893-18 Historical

Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023)

WITHDRAWN published on 1.3.2018

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83.00 USD


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ASTM F1893-98 Historical

Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices

WITHDRAWN published on 10.5.1998

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83.00 USD


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ASTM F1893-98(2003) Historical

Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices

WITHDRAWN published on 10.5.1998

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83.00 USD


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ASTM F1894-98 Historical

Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness

WITHDRAWN published on 10.5.1998

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83.00 USD


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ASTM F1894-98(2003) Historical

Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness

WITHDRAWN published on 10.5.1998

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83.00 USD


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ASTM F1894-98(2011) Historical

Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness (Withdrawn 2020)

WITHDRAWN published on 1.6.2011

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83.00 USD


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ASTM F1895-10 Historical

Practice for Submersion of a Membrane Switch

WITHDRAWN published on 1.5.2010

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73.00 USD


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