ASTM - American technical standards - Page 8676

Standards ASTM - American technical standards - Page 8676

ASTM – The company, ASTM International, belongs to the largest independent worldwide companies that deal with the development of standards, they are a reliable source of technical standards for materials, products, systems and services. ASTM International standards are known for their high technical quality and market relevancy and that is why they have an important role in the information infrastructure, which conducts projecting, manufacturing and trade in global economy. ASTM publishes standards dealing with metals, combustibility, chemical products, lubricants, fossil fuels, textiles, paints, rubber, piping, forensic sciences, electronics, energetic industry, medical devices and many other subjects.

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ASTM F530-81(1987) Historical

Test Method for Wavefront Distortion of Laser Rods (Withdrawn 1994)

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ASTM F531-81(1987) Historical

Test Method for Wavefront Distortion and Face Parallelism of Laser Disks (Withdrawn 1994)

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ASTM F532-81(1987) Historical

Test Methods for Measuring Width of Defects in Optical Surfaces, Using Nomarski Differential Microscopy (Withdrawn 1994)

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ASTM F532-81(1987)e1 Historical

Test Methods for Measuring Width of Defects in Optical Surfaces, Using Nomarski Differential Microscopy (Includes all amendments And changes 8/13/2021).

WITHDRAWN published on 1.1.1987

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ASTM F533-02 Historical

Standard Test Method for Thickness and Thickness Variation of Silicon Wafers

WITHDRAWN published on 10.1.2002

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73.00 USD


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ASTM F533-02a Historical

Standard Test Method for Thickness and Thickness Variation of Silicon Wafers (Withdrawn 2003) (Includes all amendments And changes 8/16/2017).

WITHDRAWN published on 10.12.2002

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ASTM F533-96 Historical

Standard Test Method for Thickness and Thickness Variation of Silicon Wafers

WITHDRAWN published on 10.1.2002

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73.00 USD


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ASTM F534-02 Historical

Standard Test Method for Bow of Silicon Wafers

WITHDRAWN published on 10.1.2002

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ASTM F534-02a Historical

Standard Test Method for Bow of Silicon Wafers (Withdrawn 2003) (Includes all amendments And changes 8/16/2017).

WITHDRAWN published on 10.12.2002

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73.00 USD


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ASTM F534-97 Historical

Standard Test Method for Bow of Silicon Wafers

WITHDRAWN published on 10.1.2002

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