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Standards ASTM - American technical standards - Page 8726
ASTM – The company, ASTM International, belongs to the largest independent worldwide companies that deal with the development of standards, they are a reliable source of technical standards for materials, products, systems and services. ASTM International standards are known for their high technical quality and market relevancy and that is why they have an important role in the information infrastructure, which conducts projecting, manufacturing and trade in global economy. ASTM publishes standards dealing with metals, combustibility, chemical products, lubricants, fossil fuels, textiles, paints, rubber, piping, forensic sciences, electronics, energetic industry, medical devices and many other subjects.
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ASTM F523-93(1997)
Historical
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Standard Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces
WITHDRAWN published on 10.12.1997
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ASTM F524-77(1992)
Historical
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Test Methods for Measuring Beam Divergence of Pulsed Lasers by the Apertured-Detector Technique (Withdrawn 2001)
WITHDRAWN published on 1.1.1992
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ASTM F525-00a
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Standard Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe (Withdrawn 2003) (Includes all amendments And changes 8/16/2017).
WITHDRAWN published on 10.12.2000
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ASTM F526-11
Historical
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Standard Test Method for Measuring Dose for Use in Linear Accelerator Pulsed Radiation Effects Tests
WITHDRAWN published on 1.1.2011
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ASTM F526-16
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Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines
WITHDRAWN published on 1.6.2016
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ASTM F526-97
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Standard Test Method for Measuring Dose for Use in Linear Accelerator Pulsed Radiation Effects Tests
WITHDRAWN published on 1.1.1991
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ASTM F526-97(2003)
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Standard Test Method for Measuring Dose for Use in Linear Accelerator Pulsed Radiation Effects Tests
WITHDRAWN published on 10.12.1997
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ASTM F527-80(1991)E01
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Practice for Adjusting Photoresist Exposure Time (Withdrawn 1996)
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ASTM F528-99
Historical
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Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors
WITHDRAWN published on 10.12.1999
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ASTM F528-99(2005)
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Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors (Withdrawn 2011)
WITHDRAWN published on 10.12.1999
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