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ASTM - American technical standards - Page 8750

Standards ASTM - American technical standards - Page 8750

ASTM – The company, ASTM International, belongs to the largest independent worldwide companies that deal with the development of standards, they are a reliable source of technical standards for materials, products, systems and services. ASTM International standards are known for their high technical quality and market relevancy and that is why they have an important role in the information infrastructure, which conducts projecting, manufacturing and trade in global economy. ASTM publishes standards dealing with metals, combustibility, chemical products, lubricants, fossil fuels, textiles, paints, rubber, piping, forensic sciences, electronics, energetic industry, medical devices and many other subjects.

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Preview ASTM F614-80(1991) 1.1.1900
ASTM F614-80(1991) Historical

Test Method for Distortion of Optical Lenses Used in Photomask Fabrication (Withdrawn 1996)

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Preview ASTM F614-80(1991)e1 1.1.1991
ASTM F614-80(1991)e1 Historical

Test Method for Distortion of Optical Lenses Used in Photomask Fabrication (Includes all amendments And changes 8/13/2021).

WITHDRAWN published on 1.1.1991

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Preview ASTM F615-79(1988) 1.1.1900
ASTM F615-79(1988) Historical

Practice for Determining Safe Current Pulse Operating Regions for Metallization on Semiconductor Components (Withdrawn 1995)

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Preview ASTM F615M-95 15.5.1995 Preview of the standard
ASTM F615M-95 Historical

Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components [Metric]

WITHDRAWN published on 15.5.1995

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Preview ASTM F615M-95(2002) 15.5.1995 Preview of the standard
ASTM F615M-95(2002) Historical

Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components [Metric]

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Preview ASTM F615M-95(2008) 15.6.2008 Preview of the standard
ASTM F615M-95(2008) Historical

Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)

WITHDRAWN published on 15.6.2008

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Preview ASTM F615M-95(2013) 1.5.2013 Preview of the standard
ASTM F615M-95(2013) Historical

Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric) (Withdrawn 2022)

WITHDRAWN published on 1.5.2013

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Preview ASTM F616-92 1.1.1992 Preview of the standard
ASTM F616-92 Historical

Standard Test Method for Measuring MOSFET Drain Leakage Current

WITHDRAWN published on 1.1.1992

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Preview ASTM F616M-96 10.6.1996 Preview of the standard
ASTM F616M-96 Historical

Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric)

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Preview ASTM F616M-96(2003) 10.6.1996 Preview of the standard
ASTM F616M-96(2003) Historical

Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric) (Withdrawn 2009)

WITHDRAWN published on 10.6.1996

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