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ASTM - American technical standards - Page 8764

Standards ASTM - American technical standards - Page 8764

ASTM – The company, ASTM International, belongs to the largest independent worldwide companies that deal with the development of standards, they are a reliable source of technical standards for materials, products, systems and services. ASTM International standards are known for their high technical quality and market relevancy and that is why they have an important role in the information infrastructure, which conducts projecting, manufacturing and trade in global economy. ASTM publishes standards dealing with metals, combustibility, chemical products, lubricants, fossil fuels, textiles, paints, rubber, piping, forensic sciences, electronics, energetic industry, medical devices and many other subjects.

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Preview ASTM F672-88(1995)e1 10.6.2001 Preview of the standard
ASTM F672-88(1995)e1 Historical

Standard Test Method for Measuring Resistivity Profiles Perpendicular to the Surface of a Silicon Wafer Using a Spreading Resistance Probe (Includes all amendments And changes 3/2/2021).

WITHDRAWN published on 10.6.2001

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Preview ASTM F673-02 10.12.2002 Preview of the standard
ASTM F673-02 Historical

Standard Test Methods for Measuring Resistivity of Semiconductor Slices or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gage (Withdrawn 2003)

WITHDRAWN published on 10.12.2002

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Preview ASTM F673-90(1996)e1 1.1.1996 Preview of the standard
ASTM F673-90(1996)e1 Historical

Standard Test Methods for Measuring Resistivity of Semiconductor Slices or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gage (Includes all amendments And changes 8/16/2017).

WITHDRAWN published on 1.1.1996

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Preview ASTM F674-92(1999) 1.1.1999 Preview of the standard
ASTM F674-92(1999) Historical

Standard Practice for Preparing Silicon for Spreading Resistance Measurements (Withdrawn 2003)

WITHDRAWN published on 1.1.1999

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Preview ASTM F675-91 1.1.1900
ASTM F675-91 Historical

Test Method for Measuring Nonequilibrium Transient Photocurrents in P-N Junctions (Withdrawn 1995)

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Preview ASTM F676-97 1.1.1993 Preview of the standard
ASTM F676-97 Historical

Standard Test Method for Measuring Unsaturated TTL Sink Current

WITHDRAWN published on 1.1.1993

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Preview ASTM F676-97(2003) 10.12.1997 Preview of the standard
ASTM F676-97(2003) Historical

Standard Test Method for Measuring Unsaturated TTL Sink Current (Withdrawn 2009)

WITHDRAWN published on 10.12.1997

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Preview ASTM F677-04 1.3.2004 Preview of the standard
ASTM F677-04 Historical

Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications

WITHDRAWN published on 1.3.2004

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Preview ASTM F677-04(2009) 1.10.2009 Preview of the standard
ASTM F677-04(2009) Historical

Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications

WITHDRAWN published on 1.10.2009

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Preview ASTM F677-13 1.4.2013 Preview of the standard
ASTM F677-13 Historical

Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications (Withdrawn 2013)

WITHDRAWN published on 1.4.2013

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