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Standards ASTM - American technical standards - Page 8781
ASTM – The company, ASTM International, belongs to the largest independent worldwide companies that deal with the development of standards, they are a reliable source of technical standards for materials, products, systems and services. ASTM International standards are known for their high technical quality and market relevancy and that is why they have an important role in the information infrastructure, which conducts projecting, manufacturing and trade in global economy. ASTM publishes standards dealing with metals, combustibility, chemical products, lubricants, fossil fuels, textiles, paints, rubber, piping, forensic sciences, electronics, energetic industry, medical devices and many other subjects.
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ASTM F978-90(1996)e1
Historical
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Standard Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques (Includes all amendments And changes 3/2/2021).
WITHDRAWN published on 10.1.2001
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ASTM F979-86(1998)e1
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Standard Test Method for Hermeticity of Hybrid Microcircuit Packages Prior to Lidding (Includes all amendments And changes 3/2/2021).
WITHDRAWN published on 10.5.1998
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ASTM F979-86(2003)
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Standard Test Method for Hermeticity of Hybrid Microcircuit Packages Prior to Lidding (Withdrawn 2009)
WITHDRAWN published on 10.5.1998
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ASTM F98-72(1977)
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Recommended Practices for Determining Hermeticity of Electron Devices by a Bubble Test (Withdrawn 1990)
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ASTM F98-72(1977)e1
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Recommended Practices for Determining Hermeticity of Electron Devices by a Bubble Test (Includes all amendments And changes 8/13/2021).
WITHDRAWN published on 1.1.1977
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ASTM F98-72(2077)e1
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Recommended Practices for Determining Hermeticity of Electron Devices by a Bubble Test (Includes all amendments And changes 8/13/2021).
WITHDRAWN published on 1.1.1977
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ASTM F980-10
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Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
WITHDRAWN published on 10.6.1996
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ASTM F980-10e1
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Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices (Includes all amendments And changes 2/2/2017).
WITHDRAWN published on 1.12.2010
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ASTM F980-16
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Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
WITHDRAWN published on 1.12.2016
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ASTM F980-92
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Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
WITHDRAWN published on 1.1.1992
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