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ASTM – The company, ASTM International, belongs to the largest independent worldwide companies that deal with the development of standards, they are a reliable source of technical standards for materials, products, systems and services. ASTM International standards are known for their high technical quality and market relevancy and that is why they have an important role in the information infrastructure, which conducts projecting, manufacturing and trade in global economy. ASTM publishes standards dealing with metals, combustibility, chemical products, lubricants, fossil fuels, textiles, paints, rubber, piping, forensic sciences, electronics, energetic industry, medical devices and many other subjects.
Standard Test Method for Energy Absorbed by a Tire When Deformed by Slow-Moving Plunger
WITHDRAWN published on 15.6.2009
Selected format:Standard Test Method for Energy Absorbed by a Tire When Deformed by Slow-Moving Plunger
WITHDRAWN published on 1.6.2015
Selected format:Standard Test Method for Curl in Carbon Paper (Includes all amendments And changes 8/16/2017).
WITHDRAWN published on 10.2.2000
Selected format:Standard Test Method for Curl in Carbon Paper
WITHDRAWN published on 1.6.2005
Selected format:Standard Test Method for Curl in Carbon Paper (Withdrawn 2016)
WITHDRAWN published on 1.10.2010
Selected format:Test Method for Detection of Oxidation Induced Defects in Polished Silicon Wafers (Withdrawn 1998)
Selected format:Test Method for Flexural Strength (Modulus of Rupture) of Electronic-Grade Ceramics (Withdrawn 2001)
WITHDRAWN published on 1.1.1996
Selected format:Standard Practice for Preparation of Samples of the Constant Composition Region of Epitaxial Gallium Arsenide Phosphide for Hall Effect Measurements (Includes all amendments And changes 8/16/2017).
WITHDRAWN published on 27.5.1977
Selected format:Standard Practice for Preparation of Samples of the Constant Composition Region of Epitaxial Gallium Arsenide Phosphide for Hall Effect Measurements (Withdrawn 2008)
WITHDRAWN published on 27.5.1977
Selected format:Test Method for Determining Carrier Density in Silicon Epitaxial Layers by Capacitance-Voltage Measurements on Fabricated Junction or Schottky Diodes (Withdrawn 2001)
WITHDRAWN published on 1.1.1994
Selected format:Latest update: 2026-05-14 (Number of items: 2 277 490)
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