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Standards ASTM - American technical standards - Page 8808
ASTM – The company, ASTM International, belongs to the largest independent worldwide companies that deal with the development of standards, they are a reliable source of technical standards for materials, products, systems and services. ASTM International standards are known for their high technical quality and market relevancy and that is why they have an important role in the information infrastructure, which conducts projecting, manufacturing and trade in global economy. ASTM publishes standards dealing with metals, combustibility, chemical products, lubricants, fossil fuels, textiles, paints, rubber, piping, forensic sciences, electronics, energetic industry, medical devices and many other subjects.
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ASTM F949-09
Historical
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Standard Specification for Poly(Vinyl Chloride) (PVC) Corrugated Sewer Pipe With a Smooth Interior and Fittings
WITHDRAWN published on 1.8.2009
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ASTM F949-10
Historical
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Standard Specification for Poly(Vinyl Chloride) (PVC) Corrugated Sewer Pipe With a Smooth Interior and Fittings
WITHDRAWN published on 1.2.2010
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ASTM F949-15
Historical
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Standard Specification for Poly(Vinyl Chloride) (PVC) Corrugated Sewer Pipe With a Smooth Interior and Fittings
WITHDRAWN published on 1.4.2015
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ASTM F949-15(2019)
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Standard Specification for Poly(Vinyl Chloride) (PVC) Corrugated Sewer Pipe With a Smooth Interior and Fittings
WITHDRAWN published on 1.8.2019
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ASTM F949-20
Historical
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Standard Specification for Poly(Vinyl Chloride) (PVC) Corrugated Sewer Pipe With a Smooth Interior and Fittings
WITHDRAWN published on 15.2.2020
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ASTM F95-89(2000)
Historical
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Standard Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer (Withdrawn 2003)
WITHDRAWN published on 1.1.2000
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ASTM F950-02
Historical
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Standard Test Method for Measuring the Depth of Crystal Damage of a Mechanically Worked Silicon Slice Surface by Angle Polishing and Defect Etching (Withdrawn 2003)
WITHDRAWN published on 10.12.2002
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ASTM F950-98
Historical
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Standard Test Method for Measuring the Depth of Crystal Damage of a Mechanically Worked Silicon Slice Surface by Angle Polishing and Defect Etching
WITHDRAWN published on 10.5.1998
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ASTM F951-01
Historical
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Standard Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers
WITHDRAWN published on 10.1.2002
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ASTM F951-02
Historical
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Standard Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers (Withdrawn 2003)
WITHDRAWN published on 10.1.2002
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