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Standards SAE - American standards - Page 4347
SAE – The company, SAE International, is a global association of more than 128,000 engineers and other related technical experts from the area of aerospace and aircraft industry, automotive industry and commercial-vehicle industry. The main activity of SAE International is life-long learning and the development of standards stated on the principle of consensus. SAE International has got its charitable branch called SAE Foundation, which supports a lot of programs including the program A World In Motion® and the program Collegiate Design Series.
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SAE J175
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WHEELS — PASSENGER CARS — IMPACT PERFORMANCE REQUIREMENTS AND TEST PROCEDURES
Historical published on 1.9.1970
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SAE J175
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Wheels—Impact Test Procedure—Road Vehicles
Historical published on 1.9.2003
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SAE J1750
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Describing and Evaluating the Truck Driver´s Viewing Environment
Historical published on 1.10.2010
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SAE J1750
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DESCRIBING AND EVALUATING THE TRUCK DRIVER´S VIEWING ENVIRONMENT
Historical published on 1.3.1995
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SAE J1752/1
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Electromagnetic Compatibility Measurement Procedures for Integrated Circuits—Integrated Circuit EMC Measurement Procedures—General and Definitions
Historical published on 1.10.2006
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SAE J1752/1
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ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS—INTEGRATED CIRCUIT EMC MEASUREMENT PROCEDURES—GENERAL AND DEFINITIONS
Historical published on 1.3.1997
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SAE J1752/1
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Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions
Historical published on 1.5.2016
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SAE J1752/2
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Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
Historical published on 1.1.2003
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SAE J1752/2
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ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS—INTEGRATED CIRCUIT RADIATED EMISSIONS DIAGNOSTIC PROCEDURE 1 MHZ TO 1000 MHZ, MAGNETIC FIELD—LOOP PROBE
Historical published on 1.3.1995
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SAE J1752/2
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Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
Historical published on 1.6.2011
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