Metallic materials. Calibration and verification of static uniaxial testing machines. Part 1: Tension/compression testing machines. Calibration and verification of the force-measuring system.

WITHDRAWN published on 31.1.2016

Metallic materials. Verification of static uniaxial testing machines. Tension creep testing machines. Verification of the applied load.

WITHDRAWN published on 15.9.1999

Specification for marking of recycled paper board.

WITHDRAWN published on 15.3.1995

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Signal diodes, switching diodes and controlled avalanche diodes.

WITHDRAWN published on 15.11.1986

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diodes.

WITHDRAWN published on 15.9.1987

Identification cards. Machine readable travel documents. Machine readable passport.

WITHDRAWN published on 15.12.1995

Identification cards. Machine readable travel documents. Machine readable passport.

WITHDRAWN published on 16.1.2006

Identification cards. Machine readable travel documents. Machine readable official travel documents.

WITHDRAWN published on 15.8.1997

General criteria for the operation of testing laboratories.

WITHDRAWN published on 31.10.1989

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification.

WITHDRAWN published on 15.2.1990