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Rules for the preparation of detail specifications for semiconductor devices of assessed quality: switching diodes.
WITHDRAWN published on 1.6.1976
Selected format:Rules for the preparation of detail specifications for semiconductor devices of assessed quality. Voltage reference diodes.
WITHDRAWN published on 1.1.1979
Selected format:Rules for the preparation of detail specifications for semiconductor devices of assessed quality: voltage regulator diodes.
WITHDRAWN published on 30.9.1969
Selected format:Detail specification for silicon voltage regulator diodes. 1.5 W, 3.3 to 33 V (5%), hermetically sealed. General application category Q.
WITHDRAWN published on 15.3.1972
Selected format:Detail specification for silicon voltage regulator diodes. 400 mW, 2.7 to 33 V (5%), hermetically sealed, glass encapsulation. General application category Q.
WITHDRAWN published on 15.3.1972
Selected format:Detail specification for silicon voltage regulator diodes. 1.5 W, 6.8 to 200 V (5%), hermetically sealed. General application category C.
WITHDRAWN published on 15.3.1972
Selected format:Detail specification for silicon voltage regulator diodes. 1.0 W, 3.3 to 33 V (5%), hermetically sealed. Full assessment level.
WITHDRAWN published on 15.4.1974
Selected format:Rules for the preparation of detail specifications for semiconductor devices of assessed quality: transient suppressor diodes.
WITHDRAWN published on 31.5.1990
Selected format:Rules for the preparation of detail specifications for semiconductor devices of assessed quality: variable capacitance diodes for tuning applications.
WITHDRAWN published on 31.12.1989
Selected format:Water quality. Detection and enumeration of Escherichia coli and coliform bacteria. Membrane filtration method.
WITHDRAWN published on 31.10.2009
Selected format:Latest update: 2026-05-02 (Number of items: 2 275 366)
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