Optics and optical instruments. Test lenses for calibration of focimeters. Test lenses for focimeters used for measuring spectacle lenses.

WITHDRAWN published on 13.7.2005

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high current general purpose thyristors (greater than 50 ampere rating).

WITHDRAWN published on 17.8.1972

Optics and optical instruments. Test lenses for calibration of focimeters.

WITHDRAWN published on 15.12.1996

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: case rated bi-directional triode thyristors (triacs).

WITHDRAWN published on 1.12.1989

Pliers and nippers. Slip joint pliers. Dimensions and test values.

WITHDRAWN published on 10.12.2004

Microscopes. Graticules for eyepieces.

WITHDRAWN published on 30.11.2011

Microscopes. Imaging distances related to mechanical reference planes. Tube length 160 mm.

WITHDRAWN published on 30.6.2012

Optics and optical instruments. Microscopes. Imaging distances related to mechanical reference planes. Infinity-corrected optical systems.

WITHDRAWN published on 24.6.2003

Microscopes. Imaging distances related to mechanical reference planes. Infinity-corrected optical systems.

WITHDRAWN published on 30.9.2014

Thermal insulation. Mass transfer. Physical quantities and definitions.

WITHDRAWN published on 15.7.1996