Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high frequency, low power transistors.

WITHDRAWN published on 15.1.1971

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high power transistors for linear applications.

WITHDRAWN published on 1.5.1976

Banking. Banking telecommunication messages. Bank identifier codes.

WITHDRAWN published on 15.10.1997

Banking. Banking telecommunication messages. Business identifier code (BIC).

WITHDRAWN published on 31.1.2010

Banking. Banking telecommunication messages. Business identifier code (BIC).

WITHDRAWN published on 31.12.2014

Optics and optical instruments. Contact lenses. Determination of cytotoxicity of contact lens material. Agar overlay test and growth inhibition test.

WITHDRAWN published on 15.12.1999

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high power transistors for switching applications.

WITHDRAWN published on 1.1.1982

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: switching transistors.

WITHDRAWN published on 1.1.1982

Detail specification for low power silicon n-p-n switching transistors. 20 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level.

WITHDRAWN published on 15.7.1978

Detail specification for low power silicon n-p-n switching transistors. 20 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level.

WITHDRAWN published on 15.7.1978