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Series 1 freight containers—Classification,dimensions and ratings
Standard published on 17.3.2023
Selected format:Silicon epitaxial wafers
Standard published on 4.6.2019
Selected format:General purpose metric screw threads - The plan for pipe systems
Standard published on 9.6.2013
Selected format:Test method for measuring diameter of semiconductor wafer
Standard published on 1.8.2025
Selected format:Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array
Standard published on 30.10.2009
Selected format:Test method for crystallographic perfection of epitaxial layers in silicon—Etching technique
Standard published on 29.9.2017
Selected format:Testing method for determination of radial interstitial oxygen variation in silicon
Standard published on 30.10.2009
Selected format:Test method for carrier concentration of silicon epitaxial layers—Capacitance-voltage method
Standard published on 21.5.2021
Selected format:Glass blank of ophthalmic lenses
Standard published on 16.6.2011
Selected format:Latest update: 2026-06-30 (Number of items: 2 285 193)
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