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Standard published on 1.1.1979

General purpose metric screw threads - The plan for pipe systems

Standard published on 9.6.2013

Test method for measuring diameter of semiconductor wafer

Standard published on 1.8.2025

Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array

Standard published on 30.10.2009

Test method for crystallographic perfection of epitaxial layers in silicon—Etching technique

Standard published on 29.9.2017

Testing method for determination of radial interstitial oxygen variation in silicon

Standard published on 30.10.2009

Test method for carrier concentration of silicon epitaxial layers—Capacitance-voltage method

Standard published on 21.5.2021

Glass blank of ophthalmic lenses

Standard published on 16.6.2011

Laboratory glassware--Interchangeablespherial ground joints

Standard published on 15.2.1993

Metric threads where pressure-tight joints are made on the threads

Standard published on 30.7.2008