General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits

Standard published on 21.1.1993

Harmonic drive reducers

Standard published on 21.1.1993

Blankdetail specification for semiconductor inte-grated circuit fusible-link programmable bipolar read-only memories

Standard published on 21.1.1993

Mechanical shock - Testing machines - Characteristics and performance

Standard published on 5.11.2012

Mechanical vibration and shock—Vibration of fixed structures—Guidelines for the measurement of vibrations and evaluation of their effects on structures

Standard published on 31.12.2024

Series 1 freight containers—Classification,dimensions and ratings

Standard published on 17.3.2023

Silicon epitaxial wafers

Standard published on 4.6.2019

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Standard published on 1.1.1979

General purpose metric screw threads - The plan for pipe systems

Standard published on 9.6.2013

Test method for measuring diameter of semiconductor wafer

Standard published on 1.8.2025