Non-destructive testing—Test method for frequency scanning eddy current testing

WITHDRAWN published on 14.10.2017

Non-destructive testing—Terminology—Terms used in industrial computed tomography testing

WITHDRAWN published on 29.9.2017

Families and products of MOS memory for semiconductor integrated circuits

WITHDRAWN published on 1.1.1982

Families and products of bipolar memory for semiconductor integrated circuits

WITHDRAWN published on 1.1.1982

General principles of measuring methods of TTL circuits for semiconductor integrated circuits

WITHDRAWN published on 1.1.1982

Temperature control facilities of pharmaceutical products cold chain logistics—Specification for performance qualification

WITHDRAWN published on 14.10.2017

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WITHDRAWN published on 1.1.1964

General principles of measuring methods of HTL circuits for semiconductor integrated circuits

WITHDRAWN published on 1.1.1982

General principles of measuring methods of ECL circuits for semiconductor integrated circuits

WITHDRAWN published on 1.1.1982

Service specifications for payment of employee basic old-age insurance benefits

WITHDRAWN published on 14.10.2017