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Designation of name and model of structure ceramic materials used in electronic components
WITHDRAWN published on 1.1.1985
Selected format:Structure ceramic materials used in electronic components
WITHDRAWN published on 1.1.1985
Selected format:Structure ceramic materials used in electronic components
WITHDRAWN published on 9.9.1996
Selected format:Test methods for properties of structure ceramic used in electronic components—Test method for mean coefficient of linear expansion
WITHDRAWN published on 27.11.1985
Selected format:Test methods for properties of structure ceramic used in electronic components—Test method for dielectric loss angle tangent value
WITHDRAWN published on 27.11.1985
Selected format:Test methods for properties of structure ceramic used in electronic components—Test method for chemical durability
WITHDRAWN published on 27.11.1985
Selected format:Test methods for properties of structure ceramic used in electronic components—Test method for liquid permeability
WITHDRAWN published on 27.11.1985
Selected format:Test methods for properties of structure ceramic used in electronic components—Determination of microstructure
WITHDRAWN published on 27.11.1985
Selected format:Classification and designation of name and model of ceramic dielectric materials used for capacitors
WITHDRAWN published on 1.1.1985
Selected format:Ceramic dielectric materials used for capacitors
WITHDRAWN published on 1.1.1985
Selected format:Latest update: 2026-07-12 (Number of items: 2 286 472)
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