General principles of measuring methods of display drivers for semiconductor interface integrated circuits

WITHDRAWN published on 1.1.1986

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WITHDRAWN published on 1.1.1984

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WITHDRAWN published on 1.1.1985

Slotted countersunk flat head screws(common head style)

WITHDRAWN published on 26.9.2000

General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits

WITHDRAWN published on 28.8.1986

Reference methods of measurement for semiconductor devices

WITHDRAWN published on 1.1.1986

Detail specification for electronic component--Glass passivated high voltage rectifier silicon stack for types 2CL61, 2CL62, 2CL63, 2CL64, 2CL65, 2CL66, 2CL67, 2CL68

WITHDRAWN published on 1.1.1986

Standard method for conducting drop-weight test to determine nilductility transition temperature of ferritic steels

WITHDRAWN published on 28.8.1986

Test method for drop-weight test to determine nil-ductility transition temperature of ferritic steels

WITHDRAWN published on 13.5.2008

Sintered metal bushes determination of radial crushing strength

WITHDRAWN published on 28.8.1986