Test method for thermal shock of electronic glass

WITHDRAWN published on 1.1.1988

Test method for softening point of electronic glass

WITHDRAWN published on 1.1.1988

Test method for annealing point and strain point of electronic glass

WITHDRAWN published on 1.1.1988

Test method for viscosity of electronic glass while high temperature

WITHDRAWN published on 1.1.1988

Test method for impact resistance strength of electronic glass

WITHDRAWN published on 1.1.1988

Test method for temperature (Tk-100) -- volume resistivity of electronic glass

WITHDRAWN published on 1.1.1988

Test method for high frequency dielectric losses and dielectric constant of electronic glass

WITHDRAWN published on 1.1.1988

Inductor and transformer cores for telecommunications--Part 1:Generic specification

WITHDRAWN published on 30.6.1988

Inductor and transformer cores for telecommunications--Part 2: sectional specification: Magnetic oxide cores for inductor applications

WITHDRAWN published on 30.6.1988

Inductor and transformer cores for telecommunications--Part 2:Blank detail specification: Magnetic oxide cores for inductor applications--Assessment level A

WITHDRAWN published on 30.6.1988