Micrographics—Ouality criteria and control of micrography of technical drawings and documentations

WITHDRAWN published on 27.3.1998

Micrographics—Reflectance test target used in the test target for inspecting the quality of micrography of technical drawing

WITHDRAWN published on 11.4.1988

Nomenclature for the type of nuclear instruments

WITHDRAWN published on 1.1.1988

Test procedures for Si(Li) X-ray--Detector systems

WITHDRAWN published on 12.4.1988

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WITHDRAWN published on 1.1.1988

Basic environmental testing procedures of nuclear instruments--General program

WITHDRAWN published on 7.3.1988

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WITHDRAWN published on 1.1.1988

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WITHDRAWN published on 1.1.1988

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WITHDRAWN published on 1.1.1988

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WITHDRAWN published on 1.1.1988