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Test method for nitrogen-released and gas-absorbed dynamic curve of nitrogen-doped getter
WITHDRAWN published on 25.6.1988
Selected format:Test method for barium film distribution ofnitrogen-doped getter
WITHDRAWN published on 25.6.1988
Selected format:Test method for gettering properties ofbarium flash getter
WITHDRAWN published on 25.6.1988
Selected format:Test method for gettering properties ofnon-evaporable getter
WITHDRAWN published on 25.6.1988
Selected format:Test method for amount of filling getter
WITHDRAWN published on 25.6.1988
Selected format:Detail specification for electronic components--Ambient-rated transistor for type 3CG844 silicon PNP for high frequency amplification
WITHDRAWN published on 1.1.1988
Selected format:Detail specification for electronic components--Ambient-rated transistor for type 3CG778 silicon PNP for high frequency amplification
WITHDRAWN published on 1.1.1988
Selected format:Detail specification for electronic components--Ambient-rated transistor for type 3CG778 silicon PNP for high frequency amplification
WITHDRAWN published on 1.1.1988
Selected format:Detail specification for electronic components--Ambient-rated transistor for type 3DG2271 silicon NPN for high frequency amplification
WITHDRAWN published on 1.1.1988
Selected format:Detail specification for electronic components--Case-rated transistor for type 3DD401 silicon NPN for low frequency amplification
WITHDRAWN published on 1.1.1988
Selected format:Latest update: 2026-08-21 (Number of items: 2 298 377)
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