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GB/T 9506.5-1988 WITHDRAWN

Test method for nitrogen-released and gas-absorbed dynamic curve of nitrogen-doped getter

WITHDRAWN published on 25.6.1988

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238.80 USD


in 2 working days
GB/T 9506.6-1988 WITHDRAWN

Test method for barium film distribution ofnitrogen-doped getter

WITHDRAWN published on 25.6.1988

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238.80 USD


in 2 working days
GB/T 9506.7-1988 WITHDRAWN

Test method for gettering properties ofbarium flash getter

WITHDRAWN published on 25.6.1988

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334.80 USD


in 3 working days
GB/T 9506.8-1988 WITHDRAWN

Test method for gettering properties ofnon-evaporable getter

WITHDRAWN published on 25.6.1988

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238.80 USD


in 2 working days
GB/T 9506.9-1988 WITHDRAWN

Test method for amount of filling getter

WITHDRAWN published on 25.6.1988

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238.80 USD


in 2 working days
GB 9507-1988 WITHDRAWN

Detail specification for electronic components--Ambient-rated transistor for type 3CG844 silicon PNP for high frequency amplification

WITHDRAWN published on 1.1.1988

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622.80 USD


in 4 working days
GB 9508-1988 WITHDRAWN

Detail specification for electronic components--Ambient-rated transistor for type 3CG778 silicon PNP for high frequency amplification

WITHDRAWN published on 1.1.1988

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574.80 USD


in 4 working days
GB 9509-1988 WITHDRAWN

Detail specification for electronic components--Ambient-rated transistor for type 3CG778 silicon PNP for high frequency amplification

WITHDRAWN published on 1.1.1988

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574.80 USD


in 4 working days
GB 9510-1988 WITHDRAWN

Detail specification for electronic components--Ambient-rated transistor for type 3DG2271 silicon NPN for high frequency amplification

WITHDRAWN published on 1.1.1988

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574.80 USD


in 4 working days
GB 9511-1988 WITHDRAWN

Detail specification for electronic components--Case-rated transistor for type 3DD401 silicon NPN for low frequency amplification

WITHDRAWN published on 1.1.1988

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622.80 USD


in 4 working days

Entries shown from 93290 to 93300 out of a total of 94224 entries.


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