Test method for temperature (Tk-100) -- volume resistivity of electronic glass

WITHDRAWN published on 1.1.1988

Test method for high frequency dielectric losses and dielectric constant of electronic glass

WITHDRAWN published on 1.1.1988

Inductor and transformer cores for telecommunications--Part 1:Generic specification

WITHDRAWN published on 30.6.1988

Inductor and transformer cores for telecommunications--Part 2: sectional specification: Magnetic oxide cores for inductor applications

WITHDRAWN published on 30.6.1988

Inductor and transformer cores for telecommunications--Part 2:Blank detail specification: Magnetic oxide cores for inductor applications--Assessment level A

WITHDRAWN published on 30.6.1988

Inductor and transformer cores for telecommunications--Part 3:Sectional specification: Magnetic oxide cores for broad-band transformers

WITHDRAWN published on 30.6.1988

Inductor and transformer cores for telecommunications--Part 3: Blank detail specification: Magnetic oxide cores for broad-band transformers--Assessment levels A and B

WITHDRAWN published on 30.6.1988

Inductor and transformer cores for telecommunications.Part 4:sectional specification.Magnetic oxide cores for transformers and chokes for power applications

WITHDRAWN published on 30.6.1988

Inductor and transformer cores for telecommunications--Part 4: Blank detail specification: Magnetic oxide cores for transformers and chokes for power applications--Assessment level A

WITHDRAWN published on 30.6.1988

Dimensions of pot-cores made of magnetic oxides and associated parts

WITHDRAWN published on 30.6.1988