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Semiconductor devices—Hot carrier test on metal-oxide semiconductor(MOS) transistors
Execute Date: september 2025
Standard published on 30.5.2025
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Semiconductor devices—Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Execute Date: september 2025
Standard published on 30.5.2025
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Semiconductor devices—Stress migration test—Part 1: Copper stress migration test
Execute Date: september 2025
Standard published on 30.5.2025
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Semiconductor devices—Constant current electromigration test
Execute Date: september 2025
Standard published on 30.5.2025
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Test method for printed board—Monitoring of single plated-through hole(PTH) resistance change during temperature cycling
Execute Date: december 2025
Standard published on 30.5.2025
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Design methods for satellite-earth data transmission link of remote sensing satellites
Execute Date: december 2025
Standard published on 30.5.2025
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Visible to short-wave infrared spectral reflectance measurement of crops
Execute Date: december 2025
Standard published on 30.5.2025
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Acoustics—Determination of high-frequency sound power levels emitted by machinery and equipment
Execute Date: december 2025
Standard published on 30.5.2025
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Intelligent level requirements and evaluation methods of industrial instruments
Execute Date: december 2025
Standard published on 30.5.2025
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Internet of things—Crowd-sensing—Technical architecture
Execute Date: december 2025
Standard published on 30.5.2025
Selected format:Latest update: 2025-07-11 (Number of items: 2 208 012)
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