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GB/T 45719-2025

Semiconductor devices—Hot carrier test on metal-oxide semiconductor(MOS) transistors
Execute Date: september 2025

Standard published on 30.5.2025

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GB/T 45720-2025

Semiconductor devices—Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Execute Date: september 2025

Standard published on 30.5.2025

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GB/T 45721.1-2025

Semiconductor devices—Stress migration test—Part 1: Copper stress migration test
Execute Date: september 2025

Standard published on 30.5.2025

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GB/T 45722-2025

Semiconductor devices—Constant current electromigration test
Execute Date: september 2025

Standard published on 30.5.2025

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GB/T 45723-2025

Test method for printed board—Monitoring of single plated-through hole(PTH) resistance change during temperature cycling
Execute Date: december 2025

Standard published on 30.5.2025

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GB/T 45724-2025

Design methods for satellite-earth data transmission link of remote sensing satellites
Execute Date: december 2025

Standard published on 30.5.2025

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GB/T 45725-2025

Visible to short-wave infrared spectral reflectance measurement of crops
Execute Date: december 2025

Standard published on 30.5.2025

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GB/T 45726-2025

Acoustics—Determination of high-frequency sound power levels emitted by machinery and equipment
Execute Date: december 2025

Standard published on 30.5.2025

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GB/T 45727-2025

Intelligent level requirements and evaluation methods of industrial instruments
Execute Date: december 2025

Standard published on 30.5.2025

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GB/T 45728-2025

Internet of things—Crowd-sensing—Technical architecture
Execute Date: december 2025

Standard published on 30.5.2025

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Entries shown from 230 to 240 out of a total of 331 entries.


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