Standards GB - Chinese national standards - Page 4936

Semiconductor devices—Mechanical and climatic test methods—Part 40: Board level drop test method using a strain gauge

Standard published on 31.12.2025

Semiconductor devices—Mechanical and climatic test methods—Part 41Test method for reliability of non-volatile memory devices

Standard published on 27.2.2026

Semiconductor devices—Mechanical and climatic test methods—Part 42:Temperature and humidity storage

Standard published on 23.5.2023

Semiconductor devices—Mechanical and climatic test methods—Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

Standard published on 2.12.2025

Semiconductor devices—Mechanical and climatic test methods—Part 8Sealing

Standard published on 31.12.2025

Semiconductor devices—Mechanical and climatic test methods—Part 9Permanence of marking

Standard published on 27.2.2026

Asphalt used in roofing

Standard published on 5.10.2025

Degrees of protection provided by the integral design of rotating electrical machines (IP code)—Classification

Standard published on 11.10.2021

Audio/video,information and communication technology equipment—Part 1: Safety requirements

Standard published on 19.7.2022

Audio/video, information and communication technology equipment—Part 2: Explanatory information related to GB 4943.1—2022
Execute Date: march 2027

Standard published on 27.2.2026