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Standards GB are Chinese national standards, which are issued by China's Standardization Administration Office (SAC).
Chinese national standards are used all over China commonly labeled as GB standards. They determine the united production requirements regarding product safety and quality .
GB standards are often modified or created according to the international standards of ISO, IEC or any other international level.
Although, they are largely harmonized, GB standards may differ from international standards .
Approximately 15% of all GB standards are obligatory and they can be identified according to the prefix GB, after which the code of the standards follows:
GB – Obligatory national standards
GB/T – Optional national standards
GB/Z – National steering technical document
Chemical analysis methods and determination of physical performance of alumina—Part 7:Determination of titanium dioxide, chromium sesquioxide, cupric oxide,fluorine, chlorine, boron trioxide, phosphorus pentoxide, sulfate contents—Spectrophotometry method
Execute Date: december 2026
Standard published on 25.5.2026
Selected format:Chemical analysis methods and determination of physical performance of alumina--Determination of chromium sesquioxide content--Diphenyl carbazide photometric method
Standard published on 5.2.2004
Selected format:Chemical analysis methods and determination of physical performance of alumina--Determination of cupric oxide content--29-Dimethyl-110 phenanthroline photometric method
Standard published on 5.2.2004
Selected format:Chemical reagent - Ammonium iron(II) sulfate hexahydrate
Standard published on 12.5.2011
Selected format:Terminology and atlas for titanium and titanium alloys
Standard published on 5.10.2025
Selected format:Titanium and titanium alloy castings
Standard published on 3.9.2014
Selected format:Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge
Standard published on 6.8.2023
Selected format:Test method for measuring resistivity of silicon wafer using spreading resistance probe
Standard published on 30.10.2009
Selected format:Test method for thickness and total thickness variation of silicon slices
Standard published on 30.10.2009
Selected format:Test methods for bow of silicon wafers
Standard published on 30.10.2009
Selected format:Latest update: 2026-08-07 (Number of items: 2 292 304)
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