Cookies
We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Standards GB - Chinese national standards - Page 5606
Standards GB are Chinese national standards, which are issued by China's Standardization Administration Office (SAC).
Chinese national standards are used all over China commonly labeled as GB standards. They determine the united production requirements regarding product safety and quality .
GB standards are often modified or created according to the international standards of ISO, IEC or any other international level.
Although, they are largely harmonized, GB standards may differ from international standards .
Approximately 15% of all GB standards are obligatory and they can be identified according to the prefix GB, after which the code of the standards follows:
GB – Obligatory national standards
GB/T – Optional national standards
GB/Z – National steering technical document
Price display: excl. VAT
Displayed currency:
USD
Sort by:
GB/T 14140.1-1993
WITHDRAWN
Show all technical information.
Silicon slices and wafers—Measuring of diameter—Optical projecting method
WITHDRAWN published on 6.2.1993
Selected format:Show all technical information.
GB/T 14140.2-1993
WITHDRAWN
Show all technical information.
Silicon slices and wafers—Measuring of diameter—Micrometer method
WITHDRAWN published on 6.2.1993
Selected format:Show all technical information.
GB/T 14141-1993
WITHDRAWN
Show all technical information.
Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array
WITHDRAWN published on 6.2.1993
Selected format:Show all technical information.
GB/T 14142-1993
WITHDRAWN
Show all technical information.
Test method for crystallographic perfection of epitaxial layers in silicon by etching techniques
WITHDRAWN published on 6.2.1993
Selected format:Show all technical information.
GB/T 14143-1993
WITHDRAWN
Show all technical information.
300900m Silicon slices—Measuring of interstitial oxygen content—Infrared absorption method
WITHDRAWN published on 6.2.1993
Selected format:Show all technical information.
GB/T 14144-1993
WITHDRAWN
Show all technical information.
Test method for determination of radial interstitial oxygen variation in silicon
WITHDRAWN published on 6.2.1993
Selected format:Show all technical information.
GB/T 14145-1993
WITHDRAWN
Show all technical information.
Test method for stacking fault density of epitaxial layers of silicon by interference-contrast microscopy
WITHDRAWN published on 6.2.1993
Selected format:Show all technical information.
GB/T 14146-1993
WITHDRAWN
Show all technical information.
Silicon epitaxial layers—Determination of carrier concentration—Mercury probe Valtage-capacitance method
WITHDRAWN published on 6.2.1993
Selected format:Show all technical information.
GB/T 14146-2009
WITHDRAWN
Show all technical information.
Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
WITHDRAWN published on 30.10.2009
Selected format:Show all technical information.
GB 14147-1993
WITHDRAWN
Show all technical information.
Standard permissible limits of release of lead or cadmium from ceramic packaging vessel in contact with food
WITHDRAWN published on 15.2.1993
Selected format:Show all technical information.
Can we help you with something?
