Standards GB - Chinese national standards - Page 6224

Fixed capacitors for use in electronic equipment—Part 3:Blank detail specification:chip capacitors—Assessment level E

WITHDRAWN published on 18.3.1993

Characteristics description for shock testing machines

WITHDRAWN published on 3.2.1993

Mechanical vibration and shock—Measurement and evaluation of vibration effects on buildings—Guidelines for the use of basic standard methods

WITHDRAWN published on 3.2.1993

Mechanical vibration and shock—Vibration of buildings—Guidelines for the measurement of vibrations and evaluation of their effects on buildings

WITHDRAWN published on 24.4.2009

Vibration and shock sensitive equipment—Methods of measurement and reporting data of vibration and shock effects in buildings

WITHDRAWN published on 3.2.1993

Mechanical vibration and shock—Measurement and evaluation of shock and vibration effects on sensitive equipment in buildings

WITHDRAWN published on 27.9.2008

Technical requirement and test method for the non-glare display glass tube

WITHDRAWN published on 3.2.1993

Bayeses method of reliability demonstration testing for black and white TV receivers

WITHDRAWN published on 3.2.1993

Dimension series for neodymium-doped yttrium aluminum garnet laser rods

WITHDRAWN published on 3.2.1993

Series and products for TTL semiconductor integrated circuits—Products of series PAL

WITHDRAWN published on 3.2.1993