We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Standards GB are Chinese national standards, which are issued by China's Standardization Administration Office (SAC).
Chinese national standards are used all over China commonly labeled as GB standards. They determine the united production requirements regarding product safety and quality .
GB standards are often modified or created according to the international standards of ISO, IEC or any other international level.
Although, they are largely harmonized, GB standards may differ from international standards .
Approximately 15% of all GB standards are obligatory and they can be identified according to the prefix GB, after which the code of the standards follows:
GB – Obligatory national standards
GB/T – Optional national standards
GB/Z – National steering technical document
Textiles—Testing method for color fastness to light:Carbon arc
WITHDRAWN published on 22.11.1987
Selected format:Humidity test control for color fastness to light
WITHDRAWN published on 22.12.1987
Selected format:Textiles—Tests for color fastness—Color fastness to chlorinated water(Swimming-pool water)
WITHDRAWN published on 26.11.1998
Selected format:Textiles—Tests for color fastness—Color fastness to milling:Alkaline milling
WITHDRAWN published on 26.11.1998
Selected format:Textiles—Tests for color fastness—Color fastness to chlorination
WITHDRAWN published on 26.11.1998
Selected format:Conventions concerning electric and magnetic circuits
WITHDRAWN published on 17.12.1987
Selected format:Heat sink for power semiconductor device
WITHDRAWN published on 19.12.1987
Selected format:Heat sink for power semiconductor device—Part 1:Casting kind series
WITHDRAWN published on 4.2.2004
Selected format:Measuring method of thermal resistance and input fluid-output fluid pressure difference of heat sink for power semiconductor device
WITHDRAWN published on 19.12.1987
Selected format:Heat sink for power semiconductor device—Part 2:Measuring method of thermal resistance and input fluid-output fluid pressure difference
WITHDRAWN published on 4.2.2004
Selected format:Latest update: 2025-08-01 (Number of items: 2 211 585)
© Copyright 2025 NORMSERVIS s.r.o.