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Standards GB - Chinese national standards - Page 7713
Standards GB are Chinese national standards, which are issued by China's Standardization Administration Office (SAC).
Chinese national standards are used all over China commonly labeled as GB standards. They determine the united production requirements regarding product safety and quality .
GB standards are often modified or created according to the international standards of ISO, IEC or any other international level.
Although, they are largely harmonized, GB standards may differ from international standards .
Approximately 15% of all GB standards are obligatory and they can be identified according to the prefix GB, after which the code of the standards follows:
GB – Obligatory national standards
GB/T – Optional national standards
GB/Z – National steering technical document
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GB/T 3432.2-1989
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Series and products for TTL semiconductor integrated circuits!*Products of series 54/74H
WITHDRAWN published on 1.1.1989
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GB/T 3432.3-1989
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Series and products for TTL semiconductor integrated circuits!*Products of series 54/74 S
WITHDRAWN published on 1.1.1989
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GB/T 3432.4-1989
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Series and productsfor TTL semiconductor integrated circuits--Products of series 54/74 LS
WITHDRAWN published on 31.3.1989
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GB/T 3433-1982
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Families and products of HTL circuits for semiconductor integrated circuits
WITHDRAWN published on 1.1.1982
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GB 34330-2017
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Identification standards for solid wastes General rules
WITHDRAWN published on 29.9.2017
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GB/T 34333-2017
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Refractory products—Determination by inductively coupled plasma atomic emission spectrometry(ICP-AES)
WITHDRAWN published on 29.9.2017
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GB/T 3434-1986
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Families and products of ECL circuits for semiconductor integrated circuits
WITHDRAWN published on 2.4.1986
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GB/T 3435-1987
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Series and products for semiconductor CMOS integrated circuits—Products of families 4000
WITHDRAWN published on 21.1.1987
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GB 3436-1986
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Families and variety of operational amplifier for semiconductor integrated circuits
WITHDRAWN published on 1.1.1986
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GB/T 34361-2017
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Non-destructive testing—Test method for frequency scanning eddy current testing
WITHDRAWN published on 14.10.2017
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