GB - Chinese national standards - Page 8536

Standards GB - Chinese national standards - Page 8536

Standards GB are Chinese national standards, which are issued by China's Standardization Administration Office (SAC).
Chinese national standards are used all over China commonly labeled as GB standards. They determine the united production requirements regarding product safety and quality .
GB standards are often modified or created according to the international standards of ISO, IEC or any other international level. Although, they are largely harmonized, GB standards may differ from international standards .
Approximately 15% of all GB standards are obligatory and they can be identified according to the prefix GB, after which the code of the standards follows:
GB – Obligatory national standards
GB/T – Optional national standards
GB/Z – National steering technical document

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GB 6620-1986 WITHDRAWN

Standard method for measuring warp of silicon slices by noncontacting technique

WITHDRAWN published on 1.1.1986

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286.80 USD


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GB/T 6620-1995 WITHDRAWN

Test method for measuring warp on silicon slices by noncontact scanning

WITHDRAWN published on 18.4.1995

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334.80 USD


in 3 working days
GB 6621-1986 WITHDRAWN

Standard method for measuring surface flatness of polished silicon wafers by noncontact technique

WITHDRAWN published on 1.1.1986

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286.80 USD


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GB/T 6621-1995 WITHDRAWN

Test methods for surface flatness of silicon polished slices

WITHDRAWN published on 18.4.1995

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526.80 USD


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GB 6622-1986 WITHDRAWN

Detects of swirls and striations in chemically polished silicon wafers

WITHDRAWN published on 1.1.1986

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238.80 USD


in 3 working days
GB 6623-1986 WITHDRAWN

Standard method for measuring the surface O. S. F of polished silicon wafers

WITHDRAWN published on 1.1.1986

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238.80 USD


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GB 6624-1986 WITHDRAWN

Standard method for measuring the surface quality of polished silicon wafers by visual examination

WITHDRAWN published on 1.1.1986

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238.80 USD


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GB/T 6624-1995 WITHDRAWN

Standard method for measuring the surface quality of polished silicon slices by visual inspection

WITHDRAWN published on 18.4.1995

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238.80 USD


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GB/T 6625-1986 WITHDRAWN

Test methods for nitrogen content of nitrogen-doped getter

WITHDRAWN published on 25.7.1986

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334.80 USD


in 3 working days
GB/T 6626.1-1986 WITHDRAWN

Test methods for the characteristics of getter-mercury dispenser—Test methods for mercury yield characteristic of getter-mercury dispenser

WITHDRAWN published on 26.7.1986

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382.80 USD


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