GB - Chinese national standards - Page 8863

Standards GB - Chinese national standards - Page 8863

Standards GB are Chinese national standards, which are issued by China's Standardization Administration Office (SAC).
Chinese national standards are used all over China commonly labeled as GB standards. They determine the united production requirements regarding product safety and quality .
GB standards are often modified or created according to the international standards of ISO, IEC or any other international level. Although, they are largely harmonized, GB standards may differ from international standards .
Approximately 15% of all GB standards are obligatory and they can be identified according to the prefix GB, after which the code of the standards follows:
GB – Obligatory national standards
GB/T – Optional national standards
GB/Z – National steering technical document

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GB/T 6619-1995 WITHDRAWN

Test methods for bow of silicon slices

WITHDRAWN published on 18.4.1995

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334.80 USD


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GB 6620-1986 WITHDRAWN

Standard method for measuring warp of silicon slices by noncontacting technique

WITHDRAWN published on 1.1.1986

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286.80 USD


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GB/T 6620-1995 WITHDRAWN

Test method for measuring warp on silicon slices by noncontact scanning

WITHDRAWN published on 18.4.1995

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334.80 USD


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GB 6621-1986 WITHDRAWN

Standard method for measuring surface flatness of polished silicon wafers by noncontact technique

WITHDRAWN published on 1.1.1986

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286.80 USD


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GB/T 6621-1995 WITHDRAWN

Test methods for surface flatness of silicon polished slices

WITHDRAWN published on 18.4.1995

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526.80 USD


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GB 6622-1986 WITHDRAWN

Detects of swirls and striations in chemically polished silicon wafers

WITHDRAWN published on 1.1.1986

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238.80 USD


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GB 6623-1986 WITHDRAWN

Standard method for measuring the surface O. S. F of polished silicon wafers

WITHDRAWN published on 1.1.1986

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238.80 USD


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GB 6624-1986 WITHDRAWN

Standard method for measuring the surface quality of polished silicon wafers by visual examination

WITHDRAWN published on 1.1.1986

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238.80 USD


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GB/T 6624-1995 WITHDRAWN

Standard method for measuring the surface quality of polished silicon slices by visual inspection

WITHDRAWN published on 18.4.1995

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238.80 USD


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