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Standards DIN - German national standards - Page 16542
DIN is a protected designation of German national technical standards.
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E DIN EN 60749-27:2005-05
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Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM).
(Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 27: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Machine-Model (MM).)
WITHDRAWN published on 1.5.2005
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DIN EN 60749-27:2007-01
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Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM).
(Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 27: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Machine Model (MM).)
WITHDRAWN published on 1.1.2007
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E DIN EN 60749-27/A1:2011-10
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Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM).
(Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 27: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Machine Model (MM).)
WITHDRAWN published on 1.10.2011
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E DIN IEC 60749-28:2003-02
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Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing; Charged device model (CDM).
(Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD); Charged Device Model (CDM).)
WITHDRAWN published on 1.2.2003
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E DIN EN 60749-28:2012-07
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Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing - Direct contact charged device model (DC-CDM).
(Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Direct Contact Charged Device Model (DC-CDM).)
WITHDRAWN published on 1.7.2012
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DIN EN 60749-28:2018-02
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VDE 0884-749-28. Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level.
(VDE 0884-749-28. Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level.)
WITHDRAWN published on 1.2.2018
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E DIN EN IEC 60749-28:2024-05
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VDE 0884-749-28. Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level.
(VDE 0884-749-28. Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level.)
WITHDRAWN published on 1.5.2024
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E DIN EN 60749-29:2002-09
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Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test.
(Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 29: Latch-up-Prüfung.)
WITHDRAWN published on 1.9.2002
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DIN EN 60749-29:2004-07
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Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test.
(Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 29: Latch-up-Prüfung.)
WITHDRAWN published on 1.7.2004
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E DIN EN 60749-29:2009-11
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Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test.
(Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 29: Latch-up-Prüfung.)
WITHDRAWN published on 1.11.2009
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