Cookies
We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Standards VDE - German standards - Page 237
VDE - German association for electrotechnics, electronics and information technologies was founded as early as 1893. It supports modern education for professionals and high acceptance by people. It supports development of electrotechnics, electronics and information technologies and related technologies.
The main task of the association lies in safety in electrotechnics, elaboration of respected technical rules such as national and international standards, tests and certification of equipment and systems.
American version of VDE standards is marked as UL standard (Underwriters Laboratories).
Price display: excl. VAT
Displayed currency:
USD
Sort by:
DIN EN IEC 60747-17:2021-10
Show all technical information.
VDE 0884-17. Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation.
(VDE 0884-17. Halbleiterbauelemente - Teil 17: Magnetische und kapazitive Koppler für Basisisolierung und verstärkte Isolierung.)
Standard published on 1.10.2021
Selected format: German - Print design (169.90 USD)
Show all technical information.
DIN EN IEC 60747-5-5:2021-10
Show all technical information.
VDE 0884-5. Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers.
(VDE 0884-5. Halbleiterbauelemente - Teil 5-5: Optoelektronische Bauelemente - Optokoppler.)
Standard published on 1.10.2021
Selected format: German - Print design (175.90 USD)
Show all technical information.
DIN EN IEC 60749-17:2019-11
Show all technical information.
VDE 0884-749-17. Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation.
(VDE 0884-749-17. Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 17: Neutronenbestrahlung.)
Standard published on 1.11.2019
Selected format: German - Print design (51.40 USD)
Show all technical information.
E DIN EN IEC 60749-21:2025-04
Show all technical information.
VDE 0884-749-21. Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability.
(VDE 0884-749-21. Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 21: Lötbarkeit.)
Standard published on 1.4.2025
Selected format: German - Print design (33.30 USD)
Show all technical information.
E DIN EN IEC 60749-24:2025-04
Show all technical information.
VDE 0884-749-24. Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST.
(VDE 0884-749-24. Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 24: Beschleunigte Verfahren für Feuchtebeständigkeit - Hochbeschleunigte Wirkung (HAST) ohne elektrische Beanspruchung.)
Standard published on 1.4.2025
Selected format: German - Print design (24.40 USD)
Show all technical information.
DIN EN IEC 60749-26:2018-10
Show all technical information.
VDE 0884-749-26. Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM).
(VDE 0884-749-26. Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 26: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Human Body Model (HBM).)
Standard published on 1.10.2018
Selected format: German - Print design (162.80 USD)
Show all technical information.
E DIN EN IEC 60749-26:2025-10
Show all technical information.
VDE 0884-749-26. Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM).
(VDE 0884-749-26. Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 26: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Human Body Model (HBM).)
Standard published on 1.10.2025
Selected format: German - Print design (72.00 USD)
Show all technical information.
DIN EN IEC 60749-28:2024-12
Show all technical information.
VDE 0884-749-28. Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level.
(VDE 0884-749-28. Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level.)
Standard published on 1.12.2024
Selected format: German - Print design (148.60 USD)
Show all technical information.
DIN EN IEC 60749-5:2024-09
Show all technical information.
VDE 0884-749-5. Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test.
(VDE 0884-749-5. Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung.)
Standard published on 1.9.2024
Selected format: German - Print design (61.60 USD)
Show all technical information.
E DIN EN IEC 60749-7:2025-04
Show all technical information.
VDE 0884-749-7. Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases.
(VDE 0884-749-7. Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 7: Messung des inneren Feuchtegehalts und Analyse von anderen Restgasen.)
Standard published on 1.4.2025
Selected format: German - Print design (24.40 USD)
Show all technical information.
Can we help you with something?
