Corrigendum 1 - General requirements for arc fault detection devices
(Corrigendum 1 - Exigences generales des dispositifs pour la detection de defaut d´arcs)

Correction published on 27.11.2013

General requirements for arc fault detection devices
(Exigences generales des dispositifs pour la detection de defauts d´arc)

Standard published on 9.2.2017

General requirements for arc fault detection and protection devices (AFDDs)
(Exigences generales des dispositifs pour la detection et la protection de defaut d´arcs (DPDA))

Standard published on 17.11.2022

Nanomanufacturing - Key control characteristics - Part 11-1: Electromagnetic compatibility - Shielding effectiveness of nanomaterials: near-field probe method

Standard published on 13.8.2025

Nanomanufacturing - Key control characteristics - Part 12-3: 2D material-related products - Schottky barrier heights of 2D material-based field-effect transistors: temperature-dependent current–voltage measurements

Standard published on 9.6.2026

Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance

Standard published on 29.5.2012

Nanomanufacturing - Key control characteristics - Part 2-4: Carbon nanotube materials - Test methods for determination of resistance of individual carbon nanotubes

Standard published on 9.4.2020

Nanomanufacturing - Key control characteristics - Part 2-5: Carbon nanotube materials - Mass density of vertically-aligned carbon nanotubes: X-ray absorption method

Standard published on 8.11.2022

Nanomanufacturing - Key control characteristics - Part 2-6: Carbon nanotube-related products - Thermal diffusivity of vertically-aligned carbon nanotubes: flash method

Standard published on 7.8.2024

Nanomanufacturing - Key control characteristics - Part 3-1: Luminescent nanomaterials - Quantum efficiency
(Nanofabrication - Caracteristiques de controle cle - Partie 3-1: Nanomateriaux luminescents - Rendement quantique)

Standard published on 22.5.2014