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Standards IEC - International electro-technical commission - Page 1058
IEC – The company IEC is world-leading organization, which creates and issues International standards for all electrical, electronic and other related technologies known generally as electro-technologies. Wherever, there is electricity and electronics you can find the company IEC, which promotes the safety and performance, the environment, electrical energy efficiency and renewable energy. The company IEC also administers conformity assessment systems, which certify that the equipment, systems or components comply with International Standards of this company.
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IEC/TS 63064-ed.1.0
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Graphical symbols for diagrams - Guidance on design for standardization in IEC 60617
Standard published on 23.1.2018
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IEC/TR 63065-ed.1.0
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Guidelines for operation and maintenance of line commutated converter (LCC) HVDC converter station
Standard published on 15.9.2017
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IEC/TR 63065-ed.1.0/Amd.1
Change
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Amendment 1 - Guidelines for operation and maintenance of line commutated converter (LCC) HVDC converter station
Change published on 3.6.2022
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IEC/TR 63065-ed.1.1+Amd.1-CSV
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Guidelines for operation and maintenance of line commutated converter (LCC) HVDC converter station
Standard published on 3.6.2022
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IEC/TS 63066-ed.1.0
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Low-voltage docking connectors for removable energy storage units
Standard published on 22.3.2017
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IEC 63067-ed.1.0
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Electrical installations for lighting and beaconing of aerodromes - Connecting devices - General requirements and tests
(Installations electriques pour l´eclairage et le balisage des aerodromes - Dispositifs de connexion - Exigences generales et essais)
Standard published on 24.6.2020
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IEC 63068-1-ed.1.0
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Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects
Standard published on 30.1.2019
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IEC 63068-2-ed.1.0
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Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection
Standard published on 30.1.2019
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IEC 63068-3-ed.1.0
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Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
(Dispositifs a semiconducteurs - Criteres de reconnaissance non destructifs des defauts au sein d’une plaquette homoepitaxiale de carbure de silicium pour des dispositifs d’alimentation - Partie 3 : Methode d’essai pour les defauts a l’aide de la photoluminescence)
Standard published on 13.7.2020
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IEC 63068-4-ed.1.0
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Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
Standard published on 27.7.2022
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