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Standards IEC - International electro-technical commission - Page 767
IEC – The company IEC is world-leading organization, which creates and issues International standards for all electrical, electronic and other related technologies known generally as electro-technologies. Wherever, there is electricity and electronics you can find the company IEC, which promotes the safety and performance, the environment, electrical energy efficiency and renewable energy. The company IEC also administers conformity assessment systems, which certify that the equipment, systems or components comply with International Standards of this company.
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IEC 61967-2-ed.1.0
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
(Circuits integres - Mesure des emissions electromagnetiques, 150 kHz a 1 GHz - Partie 2: Mesure des emissions rayonnees - Methode de cellule TEM et cellule TEM a large bande)
Standard published on 29.9.2005
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IEC/TS 61967-3-ed.2.0
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Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
(Circuits integres - Mesure des emissions electromagnetiques - Partie 3: Mesure des emissions rayonnees - Methode de balayage en surface)
Standard published on 25.8.2014
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IEC/TR 61967-4-1-ed.1.0
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method - Application guidance to IEC 61967-4
Standard published on 7.2.2005
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IEC 61967-4-ed.2.0
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Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
(Circuits integres - Mesure des emissions electromagnetiques - Partie 4: Mesure des emissions conduites - Methode par couplage direct 1 ohm/150 ohms)
Standard published on 16.3.2021
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IEC 61967-4-ed.2.0-RLV
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Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
Standard published on 16.3.2021
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IEC 61967-6-ed.1.0
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
(Circuits integres - Mesure des emissions electromagnetiques, 150 kHz a 1 GHz - Partie 6: Mesure des emissions conduites - Methode de la sonde magnetique)
Standard published on 25.6.2002
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IEC 61967-6-ed.1.0/Amd.1
Change
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Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
(Amendement 1 - Circuits integres - Mesure des emissions electromagnetiques, 150 kHz a 1 GHz - Partie 6: Mesure des emissions conduites - Methode de la sonde magnetique)
Change published on 12.3.2008
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IEC 61967-6-ed.1.0/Cor.1
Correction
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Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
(Corrigendum 1 - Circuits integres - Mesure des emissions electromagnetiques, 150 kHz a 1 GHz - Partie 6: Mesure des emissions conduites - Methode de la sonde magnetique)
Correction published on 30.8.2010
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IEC 61967-6-ed.1.1+Amd.1-CSV
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
(Circuits integres - Mesure des emissions electromagnetiques, 150 kHz a 1 GHz - Partie 6: Mesure des emissions conduites - Methode de la sonde magnetique)
Standard published on 24.6.2008
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IEC 61967-8-ed.2.0
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Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
(Circuits integres - Mesure des emissions electromagnetiques - Partie 8: Mesure des emissions rayonnees - Methode de la ligne TEM a plaques (stripline) pour circuit integre)
Standard published on 3.5.2023
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