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Standards IEC - International electro-technical commission - Page 801
IEC – The company IEC is world-leading organization, which creates and issues International standards for all electrical, electronic and other related technologies known generally as electro-technologies. Wherever, there is electricity and electronics you can find the company IEC, which promotes the safety and performance, the environment, electrical energy efficiency and renewable energy. The company IEC also administers conformity assessment systems, which certify that the equipment, systems or components comply with International Standards of this company.
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IEC 62047-33-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
Standard published on 5.4.2019
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IEC 62047-34-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Standard published on 5.4.2019
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IEC 62047-35-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 35: Test method of electrical characteristics under bending deformation for flexible electro-mechanical devices
(Dispositifs a semiconducteurs - Dispositifs microelectromecaniques - Partie 35 : Methode d’essai des caracteristiques electriques sous deformation par courbure de dispositifs electromecaniques souples)
Standard published on 22.11.2019
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IEC 62047-36-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Standard published on 5.4.2019
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IEC 62047-37-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods of MEMS piezoelectric thin films for sensor application
(Dispositifs a semiconducteurs - Dispositifs microelectromecaniques - Partie 37: Methodes d’essai d’environnement des couches minces piezoelectriques MEMS pour les applications de type capteur)
Standard published on 28.4.2020
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IEC 62047-38-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 38: Test method for adhesion strength of metal powder paste in MEMS interconnection
Standard published on 23.6.2021
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IEC 62047-4-ed.2.0
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Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
Standard published on 7.1.2026
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IEC 62047-4-ed.2.0-RLV
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Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
Standard published on 7.1.2026
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IEC 62047-40-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold
Standard published on 3.9.2021
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IEC 62047-41-ed.1.0
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Semiconductor devices - Micro-electromechanical devices - Part 41: RF MEMS circulators and isolators
(Dispositifs a semiconducteurs - Dispositifs microelectromecaniques - Partie 41: Circulateurs et isolateurs a MEMS RF)
Standard published on 15.6.2021
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