Cookies
We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Standards IEC - International electro-technical commission - Page 863
IEC – The company IEC is world-leading organization, which creates and issues International standards for all electrical, electronic and other related technologies known generally as electro-technologies. Wherever, there is electricity and electronics you can find the company IEC, which promotes the safety and performance, the environment, electrical energy efficiency and renewable energy. The company IEC also administers conformity assessment systems, which certify that the equipment, systems or components comply with International Standards of this company.
Price display: excl. VAT
Displayed currency:
USD
Sort by:
IEC/TS 62404-ed.1.0
Show all technical information.
Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3)
Standard published on 20.2.2007
Selected format:Show all technical information.
IEC 62415-ed.1.0
Show all technical information.
Semiconductor devices - Constant current electromigration test
(Dispositifs a semiconducteurs - Essai d´electromigration en courant constant)
Standard published on 19.5.2010
Selected format:Show all technical information.
IEC 62416-ed.1.0
Show all technical information.
Semiconductor devices - Hot carrier test on MOS transistors
(Dispositifs a semiconducteurs - Essai de porteur chaud sur les transistors MOS)
Standard published on 26.4.2010
Selected format:Show all technical information.
IEC 62417-ed.1.0
Show all technical information.
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
(Dispositifs a semiconducteurs - Essais d´ions mobiles pour transistors a semiconducteurs a oxyde metallique a effet de champ (MOSFETs))
Standard published on 22.4.2010
Selected format:Show all technical information.
IEC 62418-ed.1.0
Show all technical information.
Semiconductor devices - Metallization stress void test
(Dispositifs a semiconducteurs - Essai sur les cavites dues aux contraintes de la metallisation)
Standard published on 22.4.2010
Selected format:Show all technical information.
IEC 62419-ed.1.0
Show all technical information.
Control technology - Rules for the designation of measuring instruments
(Technologie de commande et de regulation - Regles pour la designation des instruments de mesure)
Standard published on 5.11.2008
Selected format:Show all technical information.
IEC 62420-ed.1.0
Show all technical information.
Concentric lay stranded overhead electrical conductors containing one or more gap(s)
(Conducteurs pour lignes electriques aeriennes cables en couches concentriques comprenant un ou plusieurs intervalles)
Standard published on 25.4.2008
Selected format:Show all technical information.
IEC 62421-ed.1.0
Show all technical information.
Electronics assembly technology - Electronic modules
(Techniques d´assemblage des composants electroniques - Modules electroniques)
Standard published on 24.8.2007
Selected format:Show all technical information.
IEC/TR 62422-ed.1.0
Show all technical information.
Environmental characterization of solid insulating materials
Standard published on 29.3.2007
Selected format:Show all technical information.
IEC 62423-ed.2.0
Show all technical information.
Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses
(Interrupteurs automatiques a courant differentiel residuel de type B et de type F avec et sans protection contre les surintensites incorporee pour usages domestiques et analogues)
Standard published on 20.11.2009
Selected format:Show all technical information.
Can we help you with something?
