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IEC – The company IEC is world-leading organization, which creates and issues International standards for all electrical, electronic and other related technologies known generally as electro-technologies. Wherever, there is electricity and electronics you can find the company IEC, which promotes the safety and performance, the environment, electrical energy efficiency and renewable energy. The company IEC also administers conformity assessment systems, which certify that the equipment, systems or components comply with International Standards of this company.
Ferrite cores - Technology approval schedule (TAS)
Standard published on 12.10.2004
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Radiation protection instrumentation - Alarming personal radiation devices (PRDs) for the detection of illicit trafficking of radioactive material
(Instrumentation pour la radioprotection - Dispositifs individuels d´alarme aux rayonnements pour la detection du trafic illicite des matieres radioactives)
Standard published on 15.12.2017
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Obsolescence management
(Gestion de l´obsolescence)
Standard published on 29.5.2019
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High density recording format on CD-R/RW disc systems - HD-BURN format
(Format d´enregistrement a haute densite sur un systeme a disque CD-R/RW - Format HD-BURN)
Standard published on 24.6.2005
Selected format:Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3)
Standard published on 20.2.2007
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Semiconductor devices - Constant current electromigration test
(Dispositifs a semiconducteurs - Essai d´electromigration en courant constant)
Standard published on 19.5.2010
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Semiconductor devices - Hot carrier test on MOS transistors
(Dispositifs a semiconducteurs - Essai de porteur chaud sur les transistors MOS)
Standard published on 26.4.2010
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Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
(Dispositifs a semiconducteurs - Essais d´ions mobiles pour transistors a semiconducteurs a oxyde metallique a effet de champ (MOSFETs))
Standard published on 22.4.2010
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Semiconductor devices - Metallization stress void test
(Dispositifs a semiconducteurs - Essai sur les cavites dues aux contraintes de la metallisation)
Standard published on 22.4.2010
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Control technology - Rules for the designation of measuring instruments
(Technologie de commande et de regulation - Regles pour la designation des instruments de mesure)
Standard published on 5.11.2008
Selected format:Latest update: 2025-07-21 (Number of items: 2 209 006)
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