Standards IEC - International electro-technical commission - Page 888

Audio/video, information and communication technology equipment - Part 3: Safety aspects for DC power transfer through communication cables and ports
(Equipements des technologies de l´audio/video, de l´information et de la communication - Partie 3: Aspects lies a la securite relatifs au transfert de puissance en courant continu au moyen de cables et d’acces de communication)

Standard published on 7.12.2017

Evaluation of human exposure to electromagnetic fields from short range devices (SRDs) in various applications over the frequency range 0 GHz to 300 GHz - Part 1: Fields produced by devices used for electronic article surveillance, radio frequency identification and similar systems
(Evaluation de l´exposition humaine aux champs electromagnetiques produits par les dispositifs radio a courte portee dans la plage de frequence 0 GHz a 300 GHz - Partie 1: Champs produits par les dispositifs utilises pour la surveillance electronique des objets, l´identification par radiofrequence et les systemes similaires)

Standard published on 28.8.2008

Electroacoustics - Instruments for the measurement of sound intensity - Electromagnetic and electrostatic compatibility requirements and test procedures
(Electroacoustique - Instruments pour la mesure de l´intensite acoustique - Exigences concernant les compatibilites electromagnetiques et electrostatiques et procedures d´essai)

Standard published on 10.5.2004

Amendment 1 - Electroacoustics - Instruments for the measurement of sound intensity - Electromagnetic and electrostatic compatibility requirements and test procedures

Change published on 8.3.2017

Electroacoustics - Instruments for the measurement of sound intensity - Electromagnetic and electrostatic compatibility requirements and test procedures

Standard published on 8.3.2017

Characteristics of hollow pressurised and unpressurised ceramic and glass insulators for use in electrical equipment with rated voltages greater than 1000 V

Standard published on 14.5.2008

Nuclear instrumentation - Housed scintillators - Test methods of light output and intrinsic resolution
(Instrumentation nucleaire - Scintillateurs montes - Methodes d´essai de lumiere sortante et de resolution intrinseque)

Standard published on 3.2.2021

Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET
(Dispositifs a semiconducteurs - Essai de stabilite de temperature en polarisation pour transistors a effet de champ metal-oxyde-semiconducteur (MOSFET) - Partie 1: Essai rapide de BTI pour les MOSFET)

Standard published on 15.7.2020

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
(Essai de stabilite de temperature en polarisation pour transistors a effet de champ metal-oxyde-semiconducteur (MOSFET))

Standard published on 18.7.2006

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
(Dispositifs a semiconducteurs - Partie 1: Essai de rupture dielectrique en fonction du temps (TDDB) pour les couches intermetalliques)

Standard published on 29.9.2010