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Standards IEEE - Advanced technology for mankind - Page 263
IEEE association, which promotes the innovations and advanced technologies on behalf of mankind, is the biggest technical professional company. Its purpose is to serve the specialists who work in all branches of electrical engineering, electronics, computer technology and related fields of science and technology, which are parts of modern civilization. IEEE´s roots date back to 1884, when electricity began to influence society significantly. At that time there was one major established electrical branch, the telegraph, thanks to that in the 40s in the 19th century the world was linked through the data communication system faster than transport. Telephone industry, energy industry and light industry just began to be developed.
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IEEE 1500-2005
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IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
WITHDRAWN published on 29.8.2005
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IEEE 1502-2007
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IEEE Recommended Practice for Radar Cross-Section Test Procedures
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IEEE 15026-1-2011
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IEEE Trial-Use Standard--Adoption of ISO/IEC TR 15026-1:2010 Systems and Software Engineering--Systems and Software Assurance--Part 1: Concepts and Vocabulary
WITHDRAWN published on 3.6.2011
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IEEE/ISO/IEC 15026-1-2014
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IEEE Standard Adoption of ISO/IEC 15026-1--Systems and Software Engineering--Systems and Software Assurance--Part 1: Concepts and Vocabulary
WITHDRAWN published on 4.11.2014
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IEEE/ISO/IEC 15026-1-2019
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ISO/IEC/IEEE International Standard - Systems and software engineering--Systems and software assurance --Part 1:Concepts and vocabulary
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IEEE 15026-2-2011
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IEEE Standard--Adoption of ISO/IEC 15026-2:2011 Systems and Software Engineering--Systems and Software Assurance--Part 2: Assurance Case
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IEEE 15026-4-2013
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IEEE Standard Adoption of ISO/IEC 15026-4--Systems and Software Engineering--Systems and Software Assurance--Part 4: Assurance in the Life Cycle
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IEEE 1505-2006
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IEEE Standard for Receiver Fixture Interface
WITHDRAWN published on 16.4.2007
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IEEE 1505-2010
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IEEE Standard for Receiver Fixture Interface
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IEEE 1505.1-2008
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IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
WITHDRAWN published on 1.8.2013
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