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Standards IEEE - Advanced technology for mankind - Page 275
IEEE association, which promotes the innovations and advanced technologies on behalf of mankind, is the biggest technical professional company. Its purpose is to serve the specialists who work in all branches of electrical engineering, electronics, computer technology and related fields of science and technology, which are parts of modern civilization. IEEE´s roots date back to 1884, when electricity began to influence society significantly. At that time there was one major established electrical branch, the telegraph, thanks to that in the 40s in the 19th century the world was linked through the data communication system faster than transport. Telephone industry, energy industry and light industry just began to be developed.
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IEEE 167-1966
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IEEE Test Procedure for Facsimile
WITHDRAWN published on 29.6.1966
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IEEE 1671-2006
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
WITHDRAWN published on 15.12.2006
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IEEE 1671-2010
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
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IEEE 1671.1-2009
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
WITHDRAWN published on 11.12.2009
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IEEE 1671.2-2008
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IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
WITHDRAWN published on 17.12.2008
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IEEE 1671.2-2012
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IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
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IEEE 1671.3-2007
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
WITHDRAWN published on 28.3.2008
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IEEE 1671.4-2007
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information
WITHDRAWN published on 30.4.2008
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IEEE 1671.5-2008
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information
WITHDRAWN published on 1.2.2012
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IEEE 1671.6-2008
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
WITHDRAWN published on 1.2.2013
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