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Standards IEEE - Advanced technology for mankind - Page 284
IEEE association, which promotes the innovations and advanced technologies on behalf of mankind, is the biggest technical professional company. Its purpose is to serve the specialists who work in all branches of electrical engineering, electronics, computer technology and related fields of science and technology, which are parts of modern civilization. IEEE´s roots date back to 1884, when electricity began to influence society significantly. At that time there was one major established electrical branch, the telegraph, thanks to that in the 40s in the 19th century the world was linked through the data communication system faster than transport. Telephone industry, energy industry and light industry just began to be developed.
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IEEE 1665-2009
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IEEE Guide for the Rewind of Synchronous Generators, 50 Hz and 60 Hz, Rated 1 MVA and Above
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IEEE 1666-2011
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IEEE Standard for Standard SystemC Language Reference Manual
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IEEE 1667-2006
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IEEE Standard Protocol for Authentication in Host Attachments of Transient Storage Devices
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IEEE 1667-2009
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IEEE Standard for Authentication in Host Attachments of Transient Storage Devices
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IEEE 1667-2015
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IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices
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IEEE 1668-2014
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IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V
WITHDRAWN published on 22.9.2014
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IEEE 167-1966
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IEEE Test Procedure for Facsimile
WITHDRAWN published on 29.6.1966
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IEEE 1671-2006
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
WITHDRAWN published on 15.12.2006
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IEEE 1671-2010
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
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IEEE 1671.1-2009
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
WITHDRAWN published on 11.12.2009
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