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Standards IEEE - Advanced technology for mankind - Page 473
IEEE association, which promotes the innovations and advanced technologies on behalf of mankind, is the biggest technical professional company. Its purpose is to serve the specialists who work in all branches of electrical engineering, electronics, computer technology and related fields of science and technology, which are parts of modern civilization. IEEE´s roots date back to 1884, when electricity began to influence society significantly. At that time there was one major established electrical branch, the telegraph, thanks to that in the 40s in the 19th century the world was linked through the data communication system faster than transport. Telephone industry, energy industry and light industry just began to be developed.
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IEEE C62.23-1995
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IEEE Application Guide for Surge Protection of Electric Generating Plants
WITHDRAWN published on 18.3.1995
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IEEE C62.31-1987
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IEEE Standard Test Specification for Gas-Tube Surge Protective Devices
WITHDRAWN published on 14.2.1989
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IEEE C62.31-2006
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IEEE Standard Test Methods for Low-Voltage Gas-Tube Surge-Protective Device Components
WITHDRAWN published on 8.12.2006
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IEEE C62.32-1981
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IEEE Standard Test Specifications for Low-Voltage Air Gap Surge-Protective Devices (Excluding Valve and Expulsion Type Devices)
WITHDRAWN published on 11.12.1981
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IEEE C62.32-2004
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IEEE Standard Test Methods for Low-Voltage Air Gap Surge-Protective Device Components (Excluding Valve and Expulsion Types)
WITHDRAWN published on 11.5.2005
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IEEE C62.33-1982
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IEEE Standard Test Specifications for Varistor Surge-Protective Devices
WITHDRAWN published on 30.11.1981
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IEEE C62.34-1996
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IEEE Standard for Performance of Low-Voltage Surge-Protective Devices (Secondary Arresters)
WITHDRAWN published on 1.1.1996
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IEEE C62.35-1987
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IEEE Standard Test Specifications for Avalanche Junction Semiconductor Surge Protective Devices
WITHDRAWN published on 31.1.1989
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IEEE C62.35-2010
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IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components
WITHDRAWN published on 31.8.2010
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IEEE C62.35-2010/Cor 1-2018
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IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components--Corrigendum 1
WITHDRAWN published on 12.12.2018
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